Machine learning, neural networks and statistical pattern recognition for voltage security: a comparative study

Wehenkel, Louis; Van Cutsem, Thierry; Pavella, Mania; Heilbronn, Bertrand; Pruvot, patrick

No full text

Article (Scientific journals)

Machine learning, neural networks and statistical pattern recognition for voltage security: a comparative study

Wehenkel, Louis; Van Cutsem, Thierry; Pavella, Mania et al.

1994 • In International Journal of Intelligent Systems, 2, p. 233-245

Peer Reviewed verified by ORBi

Permalink
https://hdl.handle.net/2268/144838

Files (0)Send to Details Statistics Bibliography Similar publications

Files

Full Text

No document available.

Send to

RIS BibTex APA Chicago Permalink X Linkedin

Details

Disciplines :

Electrical & electronics engineering

Author, co-author :

Wehenkel, Louis ; Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Systèmes et modélisation

Van Cutsem, Thierry ; Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Systèmes et modélisation

Pavella, Mania ; Université de Liège - ULiège > Services généraux (Faculté des sciences appliquées) > Relations académiques et scientifiques (Sciences appliquées)

Heilbronn, Bertrand

Pruvot, patrick

Language :

English

Title :

Machine learning, neural networks and statistical pattern recognition for voltage security: a comparative study

Publication date :

1994

Journal title :

International Journal of Intelligent Systems

ISSN :

0884-8173

eISSN :

1098-111X

Publisher :

John Wiley & Sons, Inc. - Engineering

Volume :

Pages :

233-245

Peer reviewed :

Peer Reviewed verified by ORBi

Funders :

F.R.S.-FNRS - Fonds de la Recherche Scientifique [BE]

Available on ORBi :

since 16 March 2013

Statistics

Number of views

64 (2 by ULiège)

Number of downloads

0 (0 by ULiège)

More statistics

Scopus citations^®

Scopus citations^®
without self-citations