Czochralski crystal growth, thermal conductivity, and magnetic properties of Pr(x)La(1- x)AlO3, where x = 1, 0.75, 0.55, 0.40, 0

Turczynski, S.; Orlinski, K.; Pawlak, D. A.; Diduszko, R.; Mucha, J.; Pekala, M.; Fagnard, Jean-François; Vanderbemden, Philippe; Carpenter, M. A.

doi:10.1021/cg101273y

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Czochralski crystal growth, thermal conductivity, and magnetic properties of Pr(x)La(1- x)AlO3, where x = 1, 0.75, 0.55, 0.40, 0

Turczynski, S.; Orlinski, K.; Pawlak, D. A. et al.

2011 • In Crystal Growth and Design, 11 (4), p. 1091-1097

Peer Reviewed verified by ORBi

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https://hdl.handle.net/2268/137308

DOI
10.1021/cg101273y

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Keywords :

Chemical compositions; Czochralski; Czochralski methods; High temperature; Ion concentrations; Low temperatures; Temperature range; Crystal growth from melt; Crystals; Lattice constants; Magnetic susceptibility; Paramagnetic materials; Paramagnetism; Praseodymium; Thermal conductivity; X ray diffraction; Lanthanum

Abstract :

[en] Crystals of Pr(x)La(1-x)AlO3 solid solution have been grown by the Czochralski method for the first time, to the best of our knowledge. Crystals with high praseodymium concentration tend to grow spirally. The color of the crystals changes with chemical composition. X-ray diffraction shows an increase of the lattice constants with an increase in lanthanum ion concentration. The thermal conductivity has been investigated in the temperature range from 5 to 300 K. Completely different behavior of thermal conductivity is observed at low temperatures for the investigated crystals, whereas it remains roughly constant at high temperatures. The values of magnetic susceptibility lie within the expected range that could be expected for a paramagnetic material. (Figure Presented) © 2011 American Chemical Society.

Research Center/Unit :

SUPRATECS - Services Universitaires pour la Recherche et les Applications Technologiques de Matériaux Électro-Céramiques, Composites, Supraconducteurs - ULiège

Disciplines :

Electrical & electronics engineering
Physics

Author, co-author :

Turczynski, S.; Institute of Electronic Materials Technology (ITME), ul. Wolczynska 133, 01-919 Warsaw, Poland

Orlinski, K.; Institute of Electronic Materials Technology (ITME), ul. Wolczynska 133, 01-919 Warsaw, Poland

Pawlak, D. A.; Institute of Electronic Materials Technology (ITME), ul. Wolczynska 133, 01-919 Warsaw, Poland

Diduszko, R.; Institute of Electronic Materials Technology (ITME), ul. Wolczynska 133, 01-919 Warsaw, Poland

Mucha, J.; Institute of Low Temperature and Structure Research, PAN, 50-950 Wrocław 2, Poland

Pekala, M.; Chemistry Department, Warsaw University, Al. Zwirki i Wigury 101, 02-089, Warsaw, Poland

Fagnard, Jean-François ; Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Capteurs et systèmes de mesures électriques

Vanderbemden, Philippe ; Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Capteurs et systèmes de mesures électriques

Carpenter, M. A.; Department of Earth Sciences, University of Cambridge, Downing Street, Cambridge CB2 3EQ, United Kingdom

Language :

English

Title :

Czochralski crystal growth, thermal conductivity, and magnetic properties of Pr(x)La(1- x)AlO3, where x = 1, 0.75, 0.55, 0.40, 0

Publication date :

2011

Journal title :

Crystal Growth and Design

ISSN :

1528-7483

eISSN :

1528-7505

Publisher :

American Chemical Society, Washington, United States - District of Columbia

Volume :

Issue :

Pages :

1091-1097

Peer reviewed :

Peer Reviewed verified by ORBi

Additional URL :

http://pubs.acs.org/doi/abs/10.1021/cg101273y

Funders :

WBI - Wallonie-Bruxelles International

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