Article (Scientific journals)
Robustness of the scanning second harmonic generation microscopy technique for characterization of hotspot patterns in plasmonic nanomaterials
Valev, VK; De Clercq, B; Zheng, X et al.
2012In Proceedings of SPIE: The International Society for Optical Engineering, 8424, p. 842411
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Keywords :
plasmonics
Abstract :
[en] Scanning second harmonic generation (SHG) microscopy is becoming an important tool for characterizing nanopatterned metal surfaces and mapping plasmonic local field enhancements. Here we study G-shaped and mirror-G-shaped gold nanostructures and test the robustness of the experimental results versus the direction of scanning, the numerical aperture of the objective, the magnification, and the size of the laser spot on the sample. We find that none of these parameters has a significant influence on the experimental results.
Disciplines :
Physics
Author, co-author :
Valev, VK;  Katholieke Universiteit Leuven - KUL
De Clercq, B;  Universiteit Hasselt - UH
Zheng, X;  Katholieke Universiteit Leuven - KUL
Biris, CG;  University College London - UCL
Panoiu, NC;  University College London - UCL
Silhanek, Alejandro  ;  Université de Liège - ULiège > Département de physique > Physique de la matière condensée
Volskiy, V;  Katholieke Universiteit Leuven - KUL
Aktsipetrov, OA;  Lomonosov Moscow State University - MSU
Vandenbosch, GAE;  Katholieke Universiteit Leuven - KUL
Ameloot, M;  Universiteit Hasselt - UH
Moshchalkov, VV;  Katholieke Universiteit Leuven - KUL
Verbiest, T;  Katholieke Universiteit Leuven - KUL
Language :
English
Title :
Robustness of the scanning second harmonic generation microscopy technique for characterization of hotspot patterns in plasmonic nanomaterials
Publication date :
2012
Journal title :
Proceedings of SPIE: The International Society for Optical Engineering
ISSN :
0277-786X
eISSN :
1996-756X
Publisher :
International Society for Optical Engineering, Bellingham, United States - Washington
Volume :
8424
Pages :
842411
Peer reviewed :
Peer reviewed
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