Article (Scientific journals)
Almost-common path interferometer using the separation of polarization states for digital phase-shifting shearography
Rosso, Vanessa; Renotte, Yvon; Habraken, Serge et al.
2007In Optical Engineering, 46 (10)
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Keywords :
liquid crystal retarder; phase-shifting; polarizing device; speckle interferometry; shearography; interferometry; metrology
Abstract :
[en] An original experimental setup for shearography with metrological applications is presented. The simplicity and the efficiency of the setup are provided by a shearing device, a prism that separates the TE and TM polarization modes with a coating and a thin glass plate placed on its face. The use of this shearing device enables an in-line and almost-common path configuration for the shearing interferometer, a path that leads to high stability and a low sensitivity to external disturbances. Moreover, the sensitivity of the interferometer can be easily adjusted for different applications by varying the shearing amount with glass plates of different thicknesses or by moving the shearing device between two lenses along the optical axis. The temporal phase-shifting method is applied through the use of a liquid crystal variable retarder. (c) 2007 Society of Photo-Optical Instrumentation Engineers.
Research center :
Service de Physique Générale, Hololab
Disciplines :
Electrical & electronics engineering
Author, co-author :
Rosso, Vanessa ;  Université de Liège - ULiège > HEC-Ecole de gestion : UER > Mathématiques appliquées aux sc. économiques et de gestion
Renotte, Yvon  ;  Université de Liège - ULiège > Département de physique > Optique - Hololab
Habraken, Serge ;  Université de Liège - ULiège > Département de physique > Optique - Hololab
Lion, Yves 
Michel, Fabrice ;  Université de Liège - ULiège > Doct. sc. (physique - Bologne)
Moreau, Vincent
Tilkens, bernard
Language :
English
Title :
Almost-common path interferometer using the separation of polarization states for digital phase-shifting shearography
Publication date :
October 2007
Journal title :
Optical Engineering
ISSN :
0091-3286
eISSN :
1560-2303
Publisher :
International Society of Optical Engineering, Bellingham, United States - Washington
Volume :
46
Issue :
10
Peer reviewed :
Peer Reviewed verified by ORBi
Available on ORBi :
since 15 May 2009

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