Model-Based Multifactor Dimensionality Reduction to detect epistasis for quantitative traits in the presence of error-free and noisy data

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Poster (Scientific congresses and symposiums)

Mahachie John, Jestinah; Van Lishout, François; Van Steen, Kristel

2010 • 19TH ANNUAL IGES CONFERENCE

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https://hdl.handle.net/2268/108929

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Disciplines :

Genetics & genetic processes

Author, co-author :

Mahachie John, Jestinah ; Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Bioinformatique

Van Lishout, François

Van Steen, Kristel

Language :

English

Title :

Model-Based Multifactor Dimensionality Reduction to detect epistasis for quantitative traits in the presence of error-free and noisy data

Publication date :

October 2010

Event name :

19TH ANNUAL IGES CONFERENCE

Event place :

Boston, United States

Audience :

International

Available on ORBi :

since 20 January 2012

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