uncertainty quantification; nanoelectromechanical system; stochastic finite element method
Abstract :
[en] This article is concerned with the probabilistic modeling of the electromechanical behavior of nanostructures to assess the effect of variations in geometrical characteristics on the device performance. The topological uncertainty that may be present in the position of the boundaries of nanostructures is accommodated by treating these boundaries as stochastic processes. It is shown how the probabilistic electromechanical models thus obtained can be discretized with the help of Galerkin projections on polynomial chaos expansions. An illustration is provided to demonstrate the proposed framework.
Disciplines :
Mechanical engineering
Author, co-author :
Arnst, Maarten ; University of Southern California > Department of Civil and Environmental Engineering
Ghanem, Roger; University of Southern California > Department of Civil and Environmental Engineering
Language :
English
Title :
Probabilistic Electromechanical Modeling of Nanostructures with Random Geometry
Publication date :
October 2009
Journal title :
Journal of Computational and Theoretical Nanoscience
ISSN :
1546-1955
eISSN :
1546-1963
Publisher :
American Scientific Publishers, Valencia, United States
scite shows how a scientific paper has been cited by providing the context of the citation, a classification describing whether it supports, mentions, or contrasts the cited claim, and a label indicating in which section the citation was made.
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