Article (Scientific journals)
Enhanced vortex pinning by a composite antidot lattice in a superconducting Pb film
Silhanek, Alejandro; Van Look, L.; Jonckheere, R. et al.
2005In Physical Review. B, Condensed Matter, 72 (1)
Peer Reviewed verified by ORBi
 

Files


Full Text
Silhanek-PRB-2005.pdf
Publisher postprint (365.75 kB)
Copyright 2005 by the American Physical Society
Download

All documents in ORBi are protected by a user license.

Send to



Details



Keywords :
superconductivity
Abstract :
[en] The use of artificial defects is known to enhance the superconducting critical parameters of thin films. In the case of conventional superconductors, regular arrays of submicron holes (antidots) substantially increase the critical temperature T-c(H) and critical current I-c(H) for all fields. Using electrical transport measurements, we study the effect of placing an additional small antidot in the unit cell of the array. This composite antidot lattice consists of two interpenetrating antidot square arrays with a different antidot size and the same lattice period. The smaller antidots are located at the centers of the cells of the large antidots array. We show that the composite antidot lattice can trap a higher number of flux quanta per unit cell inside the antidots compared to a reference antidot film without the additional small antidots. As a consequence, the field range in which an enhanced critical current is observed is considerably expanded. Finally, the possible stable vortex lattice patterns at several matching fields are determined by molecular-dynamics simulations.
Disciplines :
Physics
Author, co-author :
Silhanek, Alejandro  ;  Katholieke Universiteit Leuven - KUL
Van Look, L.
Jonckheere, R.
Zhu, B. Y.
Raedts, S.
Moshchalkov, V. V.
Language :
English
Title :
Enhanced vortex pinning by a composite antidot lattice in a superconducting Pb film
Publication date :
2005
Journal title :
Physical Review. B, Condensed Matter
ISSN :
0163-1829
eISSN :
1095-3795
Publisher :
American Institute of Physics, New York, United States - New York
Volume :
72
Issue :
1
Peer reviewed :
Peer Reviewed verified by ORBi
Available on ORBi :
since 11 November 2011

Statistics


Number of views
52 (0 by ULiège)
Number of downloads
188 (0 by ULiège)

Scopus citations®
 
115
Scopus citations®
without self-citations
107
OpenCitations
 
53
OpenAlex citations
 
58

Bibliography


Similar publications



Contact ORBi