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Ti impact in C-doped phase-change memories compliant to Pb-free soldering reflow

Perniola, L.; Noe, Pascal; Hubert, Q. et al.

2012 • In Technical Digest - International Electron Devices Meeting, IEDM, p. 18.7.1-18.7.4

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PCRAM_IEDM_2012_9.pdf

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