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Debaize Arnaud

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Main Referenced Co-authors
Gillis, Jean-Marie  (2)
Halain, Jean-Philippe  (2)
Alia, A. (1)
Bemporad, A. (1)
Bernier, Joseph  (1)
Main Referenced Keywords
APS-CMOS (1); ASPIICS (1); back-thinning (1); camera (1); Coronagraph (1);
Main Referenced Disciplines
Aerospace & aeronautics engineering (1)
Space science, astronomy & astrophysics (1)

Publications (total 2)

The most downloaded
761 downloads
Halain, J.-P., Debaize, A., Gillis, J.-M., Jacques, L., De Ridder, T., Hermans, L., Koch, M., Meynants, G., & Schippers, G. (2014). The dual-gain 10 µm back-thinned 3k x 3k CMOS-APS detector of the Solar Orbiter Extreme UV Imager. Proceedings of SPIE: The International Society for Optical Engineering, 9144. doi:10.1117/12.2055322 https://hdl.handle.net/2268/184200

The most cited

34 citations (Scopus®)

Renotte, E., Alia, A., Bemporad, A., Bernier, J., Bramanti, C., Bucklet, S., Capobianco, G., Cernica, I., Daniel, V., Darakchiev, R., Darmetko, M., Debaize, A., Denis, F., Desselle, R., De Vos, L., Dinescu, A., Fineschi, S., Fleury-Frenette, K., Focardi, M., ... Zhukov, A. (2015). Design status of ASPIICS, an externally occulted coronagraph for PROBA-3. In Proc. SPIE Volume 9604 Solar Physics and Space Weather Instrumentation VI. doi:10.1117/12.2186962 https://hdl.handle.net/2268/189158

Renotte, E., Alia, A., Bemporad, A., Bernier, J., Bramanti, C., Bucklet, S., Capobianco, G., Cernica, I., Daniel, V., Darakchiev, R., Darmetko, M., Debaize, A., Denis, F., Desselle, R., De Vos, L., Dinescu, A., Fineschi, S., Fleury-Frenette, K., Focardi, M., ... Zhukov, A. (2015). Design status of ASPIICS, an externally occulted coronagraph for PROBA-3. In Proc. SPIE Volume 9604 Solar Physics and Space Weather Instrumentation VI. doi:10.1117/12.2186962

Halain, J.-P., Debaize, A., Gillis, J.-M., Jacques, L., De Ridder, T., Hermans, L., Koch, M., Meynants, G., & Schippers, G. (2014). The dual-gain 10 µm back-thinned 3k x 3k CMOS-APS detector of the Solar Orbiter Extreme UV Imager. Proceedings of SPIE: The International Society for Optical Engineering, 9144. doi:10.1117/12.2055322

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