Correction Method of Secondary Reflection Effects in Measurement of Electrooptic Coefficient in Optically-Active Materials

The propagation of light in linearly birefringent and optically active media, such as Bi12SiO20 crystals (BSO), has been widely studied by several workers. Various measurement methods of the electro-optic coefficient r41 have been described. One family of those methods consisting in measurement of the light polarization ellipticity after travelling through the crystal has been analysed. Due to the high reflectivity of such crystals, we show that the effect of the secondary reflections can not be neglected. We present the theoretical description and analysis of this effect for one of these methods and we propose a corrective algorithm.