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Chaos based nonlinear analysis of epileptic seizure
Sahu, R.; Parija, T.; Mohapatra, B. et al.
2010In Proceedings - 3rd International Conference on Emerging Trends in Engineering and Technology, ICETET 2010
Peer reviewed
 

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Keywords :
Capacity dimension; Chaos theory; Correlation dimension; DDES; Electro-physiological signal; Lyapunov exponent; Physiological signals; Artificial Intelligence; Control and Systems Engineering; Electrical and Electronic Engineering
Abstract :
[en] Feature extraction and classification of electro-physiological signals is an important issue in development of disease diagnostic expert system (DDES). In this paper we propose a method based on chaos methodology for EEG signal classification. The nonlinear dynamics of original EEGs are quantified in the form of entropy, largest Lyapunov exponent (LLE), correlation dimension (CD), capacity dimension (CAD) and were considered for discrimination of various categories of EEG signals. After calculating the above mentioned parameters for signals, we found that without going for rigorous time-frequency domain analysis, only chaos based parameters is also suitable to classify various EEG signals. © 2010 IEEE.
Disciplines :
Neurology
Author, co-author :
Sahu, R.;  Biomedical Engg., MIET, BBSR, Orissa, India
Parija, T.;  Biomedical Engg., MIET, BBSR, Orissa, India
Mohapatra, B.;  Biomedical Engg., MIET, BBSR, Orissa, India
Rout, B.;  Biomedical Engg., MIET, BBSR, Orissa, India
Sahu, S.;  Biomedical Engg., TAT, BBSR, Orissa, India
Panda, Rajanikant  ;  Université de Liège - ULiège > GIGA > GIGA Consciousness - Coma Science Group ; Biomedical Engg., TAT, BBSR, Orissa, India
Pal, P.;  Biomedical Engg., NIT, Raipur, India
Gandhi, T.;  Biomedical Engg., AIIMS, New Delhi, India
Language :
English
Title :
Chaos based nonlinear analysis of epileptic seizure
Publication date :
December 2010
Event name :
2010 3rd International Conference on Emerging Trends in Engineering and Technology
Event place :
Ind
Event date :
19-11-2010 => 21-11-2010
By request :
Yes
Audience :
International
Main work title :
Proceedings - 3rd International Conference on Emerging Trends in Engineering and Technology, ICETET 2010
Publisher :
IEEE
ISBN/EAN :
978-0-7695-4246-1
Peer reviewed :
Peer reviewed
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since 18 January 2023

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