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Quantitative three-dimensional measurements of vibration amplitudes and phases as a function of frequency by Digital Speckle Pattern Interferometry
De Veuster, Christophe; Renotte, Yvon; Berwart, Léon et al.
1998In Proceedings of SPIE: The International Society for Optical Engineering, 3478, p. 322-333
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Keywords :
Optical metrology; Optical interferometry; ESPI
Disciplines :
Physics
Author, co-author :
De Veuster, Christophe;  Université de Liège - ULiège > Physique > HOLOLAB
Renotte, Yvon  ;  Université de Liège - ULiège > Département de physique > Optique - Hololab
Berwart, Léon;  Université de Liège - ULiège > Physique > HOLOLAB
Lion, Yves ;  Université de Liège - ULiège > Physique > HOLOLAB
Language :
English
Title :
Quantitative three-dimensional measurements of vibration amplitudes and phases as a function of frequency by Digital Speckle Pattern Interferometry
Publication date :
1998
Event name :
The International Symposium on Optical Science, Engineering, and Instrumentation, SPIE's 43rd Annual Meeting
Event organizer :
SPIE
Event place :
San Diego, United States
Event date :
19 au 24 juillet 1998
Audience :
International
Journal title :
Proceedings of SPIE: The International Society for Optical Engineering
ISSN :
0277-786X
eISSN :
1996-756X
Publisher :
SPIE - International Society for Optical Engineering, Bellingham, United States
Special issue title :
Laser Interferometry IX: Techniques and Analysis
Volume :
3478
Pages :
322-333
Peer reviewed :
Peer reviewed
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