Login
EN
[EN] English
[FR] Français
Login
EN
[EN] English
[FR] Français
Give us feedback
Explore
Search
Special collections
Statistics
News
Help
Start on ORBi
Deposit
Profile
Publication List
Add your ORCID
Tutorials
Legal Information
Training sessions
About
What's ORBi ?
Impact and visibility
Around ORBi
About statistics
About metrics
OAI-PMH
ORBi team
Release Notes
Back
Home
Detailled Reference
No full text
Unpublished conference/Abstract (Scientific congresses and symposiums)
Thickness dependence of the ferroelectric properties in perovskite ultra-thin films
Ghosez, Philippe
;
Junquera, J.
2003
•
Fundamental Physics of Ferroelectrics
Permalink
https://hdl.handle.net/2268/236688
Files (0)
Send to
Details
Statistics
Bibliography
Similar publications
Files
Full Text
No document available.
Send to
RIS
BibTex
APA
Chicago
Permalink
X
Linkedin
copy to clipboard
copied
Details
Keywords :
thickness; ferroelectricity; ultrathin films
Disciplines :
Physics
Author, co-author :
Ghosez, Philippe
;
Université de Liège - ULiège > Département de physique > Physique théorique des matériaux
Junquera, J.
Language :
English
Title :
Thickness dependence of the ferroelectric properties in perovskite ultra-thin films
Publication date :
February 2003
Event name :
Fundamental Physics of Ferroelectrics
Event place :
Williamsburg, United States
Event date :
février 2003
Audience :
International
Available on ORBi :
since 11 June 2019
Statistics
Number of views
14 (0 by ULiège)
Number of downloads
0 (0 by ULiège)
More statistics
Bibliography
Similar publications
Contact ORBi