[en] Optical characteristics in the wavelength range 15 - 75 nm of the EUV imaging telescope to be launched soon on the SOHO mission are discussed. Bandpasses and photometric sensitivity of the multilayered optics telescope have been measured by a dedicated synchrotron light source at Orsay, France.
Disciplines :
Aerospace & aeronautics engineering
Author, co-author :
Defise, Jean-Marc ; Université de Liège - ULiège > CSL : Direction générale - Satellites, missions et instruments spatiaux
Song, Xueyan Y
Delaboudiniere, Jean-Pierre
Artzner, Guy E
Carabetian, Charles
Hochedez, Jean-François
Brunaud, Jacqueline
Moses, John Daniel
Catura, Richard C
Clette, Frederic
Maucherat, Andre J
Language :
English
Title :
Calibration of the EIT instrument for the SOHO mission
Publication date :
1995
Event name :
X-Ray and EUV/FUV Spectroscopy and Polarimetry
Event place :
San Diego, United States
Event date :
11 July 1995 through 12 July 1995
Audience :
International
Journal title :
Proceedings of SPIE: The International Society for Optical Engineering
ISSN :
0277-786X
eISSN :
1996-756X
Publisher :
International Society for Optical Engineering, Bellingham, United States - Washington
