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Bandgap Measurement by Spectroscopic Ellipsometry for Strained Ge1-xSnx
Shimura, Yosuke; Wang, Wei; Nieddu, Thomas et al.
2013The 8th International Conference on Silicon Epitaxy and Heterostructures (ICSI-8)
 

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Disciplines :
Physics
Author, co-author :
Shimura, Yosuke;  IMEC
Wang, Wei;  IMEC
Nieddu, Thomas ;  Université de Liège - ULiège > 2e an. master sc. phys., fin. appr.
Gencarelli, Federica;  IMEC
Vincent, Benjamin;  IMEC
Laha, Priya;  Vrije Universiteit Brussel - VUB
Terryn, Herman;  Vrije Universiteit Brussel - VUB
Stefanov, Stefan;  Vigo University
Chiussi, Stefano;  Vigo University
Van Campenhout, Joris;  IMEC
Nguyen, Ngoc Duy  ;  Université de Liège - ULiège > Département de physique > Physique des solides, interfaces et nanostructures
Vantomme, Andre;  Katholieke Universiteit Leuven - KUL
Loo, Roger;  IMEC
More authors (3 more) Less
Language :
English
Title :
Bandgap Measurement by Spectroscopic Ellipsometry for Strained Ge1-xSnx
Publication date :
04 June 2013
Event name :
The 8th International Conference on Silicon Epitaxy and Heterostructures (ICSI-8)
Event place :
Fukuoka, Japan
Event date :
2-7 juin 2013
Audience :
International
Available on ORBi :
since 10 April 2013

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