Bandgap Measurement by Spectroscopic Ellipsometry for Strained Ge1-xSnx

Shimura, Yosuke; Wang, Wei; Nieddu, Thomas; Gencarelli, Federica; Vincent, Benjamin; Laha, Priya; Terryn, Herman; Stefanov, Stefan; Chiussi, Stefano; Van Campenhout, Joris; Nguyen, Ngoc Duy; Vantomme, Andre; Loo, Roger

No full text

Unpublished conference/Abstract (Scientific congresses and symposiums)

Bandgap Measurement by Spectroscopic Ellipsometry for Strained Ge1-xSnx

Shimura, Yosuke; Wang, Wei; Nieddu, Thomas et al.

2013 • The 8th International Conference on Silicon Epitaxy and Heterostructures (ICSI-8)

Permalink
https://hdl.handle.net/2268/146620

Files (0)Send to Details Statistics Bibliography Similar publications

Files

Full Text

No document available.

Send to

RIS BibTex APA Chicago Permalink X Linkedin

Details

Disciplines :

Physics

Author, co-author :

Shimura, Yosuke; IMEC

Wang, Wei; IMEC

Nieddu, Thomas ; Université de Liège - ULiège > 2e an. master sc. phys., fin. appr.

Gencarelli, Federica; IMEC

Vincent, Benjamin; IMEC

Laha, Priya; Vrije Universiteit Brussel - VUB

Terryn, Herman; Vrije Universiteit Brussel - VUB

Stefanov, Stefan; Vigo University

Chiussi, Stefano; Vigo University

Van Campenhout, Joris; IMEC

More authors (3 more)

Language :

English

Title :

Bandgap Measurement by Spectroscopic Ellipsometry for Strained Ge1-xSnx

Publication date :

04 June 2013

Event name :

The 8th International Conference on Silicon Epitaxy and Heterostructures (ICSI-8)

Event place :

Fukuoka, Japan

Event date :

2-7 juin 2013

Audience :

International

Available on ORBi :

since 10 April 2013

Statistics

Number of views

189 (7 by ULiège)

Number of downloads

0 (0 by ULiège)

More statistics