The effects of attentional level and test format on the resistance to false memories.

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Poster (Scientific congresses and symposiums)

Dehon, Hedwige; Lampinen, James Michael

2006 • Fourth International Conference on Memory (ICOM 4),

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https://hdl.handle.net/2268/107564

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Keywords :

false memories; divided attention; modality

Disciplines :

Theoretical & cognitive psychology

Author, co-author :

Dehon, Hedwige ; Université de Liège - ULiège > Département de Psychologie : cognition et comportement > Psychologie cognitive

Lampinen, James Michael

Language :

English

Title :

The effects of attentional level and test format on the resistance to false memories.

Publication date :

2006

Event name :

Fourth International Conference on Memory (ICOM 4),

Event organizer :

University of New SouthWales, sydney

Event place :

Sydney, Australia

Audience :

International

Available on ORBi :

since 11 January 2012

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