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See detailFANTOM PROJECT : Electronic Speckle Pattern Interferometry at Thermal Infrared Wavelengths, A New Technique for Combining Temperature and Displacement Measurements
Georges, Marc ULiege; Thizy, Cédric ULiege; Vandenrijt, Jean-François ULiege et al

Conference (2010, October)

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See detailElectronic Speckle Pattern Interferometry at Long Infrared Wavelengths. Scattering Requirements
Vandenrijt, Jean-François ULiege; Thizy, Cédric ULiege; Alexeenko, Igor et al

in Osten, Wolfgang; Kujawinska, Malgorzata (Eds.) Fringe 2009 (2009, September)

Detailed reference viewed: 66 (6 ULiège)